Search Results - piezoelectric

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050034: Improved AFM Manipulation of Nano-Objects

In traditional atomic force microscope (AFM) based nano-manipulation systems, a cantilever is used as the probe tip to manipulate nano-sized objects. Because of the need for good contact with the object, a "pre-loaded" force must be exerted by the cantilever on the object, making it difficult for an operator to "feel" the object or to adjust and...
Published: 7/21/2014   |   Inventor(s): Ning Xi, Jiangbo Zhang, Guangyong Li
Keywords(s): Atomic Force Microscope, Manipulator, Nanomanipulation, Nano-object, Nanoscale, NEMS, Piezoelectric Category(s): Mechanical, Devices, Electrical

050026: A Force Sensing Probe for Micromanipulation and Microassembly

A current limitation with existing micro-probe tips is their relatively high degree of bending when encountering objects on surfaces. This significantly limits the ability of micro-probes to manipulate micro-objects. In addition, the sensor can only have a small dynamic range in its bending if it is to maintain high accuracy in manipulating objects. Description The...
Published: 7/21/2014   |   Inventor(s): Ning Xi, Yantao Shen
Keywords(s): Active Force Balance, Force Sensor, Microassembly, Micromechanical, Piezoelectric, PVDF Category(s): Mechanical, Devices

030073: Improved Force Sensing on Nano-Manipulated Objects

Efficient manipulation of nano-sized objects will require an effective means for sensing the force exerted by a nanoprobe on the object. Current PZT (lead zirconium titante)-based piezoelectric force sensors are limited in their sensitivity. Description By using a highly sensitive polyvinylidene fluoride (PVDF) piezoelectric force sensor to measure...
Published: 7/21/2014   |   Inventor(s): Ning Xi, Yantao Shen, Fathi Salem
Keywords(s): Force Sensor, Integrated Circuit, Microassembly, Micromanipulation, Piezoelectric, Signal Processing Category(s): Electrical, Nanotechnology, Devices