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050034: Improved AFM Manipulation of Nano-Objects

In traditional atomic force microscope (AFM) based nano-manipulation systems, a cantilever is used as the probe tip to manipulate nano-sized objects. Because of the need for good contact with the object, a "pre-loaded" force must be exerted by the cantilever on the object, making it difficult for an operator to "feel" the object or to adjust and...
Published: 7/21/2014   |   Inventor(s): Ning Xi, Jiangbo Zhang, Guangyong Li
Keywords(s): Atomic Force Microscope, Manipulator, Nanomanipulation, Nano-object, Nanoscale, NEMS, Piezoelectric Category(s): Mechanical, Devices, Electrical